Electrical characteristics and optoelectronic properties of metal-semiconductor-metal structure with zinc oxide nanowires across Au electrodes

Chinese Physics B

Volumn 17, Issue 10, 2008, Pages 3875-3879

  Wang, Ding Qu ^a   Zhou, Zhao Ying ^a   Zhu, Rong ^a   Ye, Xiong Ying ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

MSM structure; Optoelectronic property; Schottky barrier; ZnO nanowire

Indexed keywords

CARBON NANOTUBES; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY; ELECTRIC NETWORK ANALYSIS; ELECTRODES; ELECTROPHORESIS; METALS; MODEL STRUCTURES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOWIRES; PHOTODETECTORS; SCHOTTKY BARRIER DIODES; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR DIODES; SEMICONDUCTOR MATERIALS; STRUCTURAL METALS; ZINC; ZINC ALLOYS; ZINC OXIDE;

AU ELECTRODES; DIELECTROPHORESIS; ELECTRICAL CHARACTERISTICS; ELECTRICAL TRANSPORTS; ELECTRONIC MODELS; LIGHT INTENSITIES; METAL STRUCTURES; MSM STRUCTURE; MSM STRUCTURES; OPTOELECTRONIC PROPERTIES; OPTOELECTRONIC PROPERTY; PHOTOELECTRIC PROPERTIES; SCHOTTKY BARRIER; SCHOTTKY CONTACTS; SCHOTTKY DIODES; SEMI-CONDUCTORS; ZINC OXIDE NANOWIRES; ZNO NANOWIRE; ZNO NANOWIRES;

ELECTRIC WIRE;

EID: 56349095468     PISSN: 16741056     EISSN: None     Source Type: Journal    
DOI: 10.1088/1674-1056/17/10/054     Document Type: Article

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