Current-voltage characteristics and parameter retrieval of semiconducting nanowires

Applied Physics Letters

Volumn 88, Issue 7, 2006, Pages

  Zhang, Z Y ^a   Jin, C H ^a   Liang, X L ^b   Chen, Q ^b   Peng, L M ^b  

^a INSTITUTE OF PHYSICS   (China)

^b PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

NANOWIRE RESISTANCE; REVERSE-BIASED SCHOTTKY BARRIERS; SEMICONDUCTING NANOWIRES;

ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; PARAMETER ESTIMATION; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR MATERIALS; TRANSPORT PROPERTIES;

NANOSTRUCTURED MATERIALS;

EID: 32944456750     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2177362     Document Type: Article

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