Toward in situ x-ray diffraction imaging at the nanometer scale

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7042, Issue , 2008, Pages

  Zatsepin, Nadia A ^a   Dilanian, Ruben A ^a   Nikulin, Andrei Y ^a   Gable, Brian M ^a   Muddle, Barry C ^a   Sakata, Osami ^b  

^a MONASH UNIVERSITY   (Australia)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

Bulk material characterization; In situ characterization; Nanoscale imaging; Non destructive; Triple crystal diffractometry; X ray diffractive

Indexed keywords

ALLOYS; ALUMINUM; COPPER; COPPER ALLOYS; DIFFRACTION; DIFFRACTOMETERS; IMAGE PROCESSING; IMAGE RECONSTRUCTION; IMAGING TECHNIQUES; INSTRUMENTS; LIGHT; LIGHT METALS; METALLIC COMPOUNDS; NANOPARTICLES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTECHNOLOGY; PRECIPITATION (CHEMICAL); SYNCHROTRONS; THREE DIMENSIONAL; X RAY ANALYSIS; X RAY DIFFRACTION; X RAY OPTICS; X RAYS;

BULK MATERIAL CHARACTERIZATION; IN SITU CHARACTERIZATION; NANOSCALE IMAGING; NON DESTRUCTIVE; TRIPLE CRYSTAL DIFFRACTOMETRY; X-RAY DIFFRACTIVE;

ELECTROMAGNETIC WAVES;

EID: 56349093496     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.794438     Document Type: Conference Paper

References (18)

1. Miao, J., Ishikawa, T., Anderson, E. H. and Hodgson, K. O., "Phase retrieval of diffraction patterns from noncrystalline samples using the oversampling method," Phys. Rev. B 67, 174104(1-6), (2003).
2. Pfeifer, M. A., Williams, G. J., Vartanyants, I. A., Harder, R. and Robinson, I. K., "Three-dimensional mapping of a deformation field inside a nanocrystal," Nature 442, 63-66 (2006).
3. Chapman, H. N., Barty, A., Marchesini, S., Noy, A., Cui, C., Howells, M. R., Rosen, R., He, H., Spence, J. C. H., Weierstall, U., Beetz, T., Jacobsen, C. and Shapiro, D., "High-resolution ab initio three-dimensional X-ray diffraction microscopy," J. Opt. Soc. Am. A , 23 (5), 1179-1200 (2006).
4. Takahashi, Y., Nishino, Y., Ishikawa, T., and Matsubara, E., "Approach for three-dimensional observation of mesoscopic precipitates in alloys by coherent x-ray diffraction microscopy," 90, 184105(1-3) (2007).
5. Williams, D. B., and Carter, C. B., [Transmission Electron Microscopy, Part I - Basics], New York and London: Plenum Press, (1996).
6. Cowley, J. M., [Diffraction Physics], (4 ed.). New York: Elsevier (1990).
7. Miller, M. K., [Atom Probe Tomography - Analysis at the Atomic Level], Dordrecht, The Netherlands: Kluwer Academic/Plenum, (2000).
8. Nikulin, A. Y., Dilanian, R. A., Zatsepin, N. A., Gable, B. M., Muddle, B. C., Souvorov, A. Y., Nishino, Y. and Ishikawa T., "3D X-ray diffraction imaging of nanoparticles using incoherent radiation," Nano Letters 7 (5) 1246-1250, (2007).
9. Eisenberger, P., Alexandropoulus, N. G. and Platzman, P. M., "X-ray Brillouin scattering," Phys. Rev. Lett. 28, 1519-1522, (1972).
10. Iida, A., & Kohra, K., "Separate measurements of dynamical and kinematical x-ray diffractions from silicon crystals with a triple crystal diffractometer," Phys. Stat. Sol. (a) , 51, 533-542, (1979).
11. Fewster, P. F., "A high-resolution multiple-crystal multiple-reflection diffractometer," J. Appl. Cryst., 22, 64-69, (1989).
12. Zaumseil P. and Winter, U., "Triple crystal diffractometer investigations of silicon Crystals with different collimator-analyzer arrangements". Phys. Stat. Sol. (a) 70 497-505 (1982).
13. Miao, J., Ishikawa, T., Johnson, B., Anderson, E. H., Lai, B., and Hodgson, K., "High resolution 3D x-ray diffraction microscopy," Phys. Rev. Lett. 89(8), 088303(1-4), (2002).
14. I Robinson. I. K., "Crystal truncation rods and surface roughness," Phys. Rev. B, 33(6), 3830-3836, (1986).
15. Gartstein, E., Mandelbrot, M., Mogilyanski, D., "Instrumental origin effects in triple axis diffraction," J. Phys. D: Appl. Phys. 34, A57-A63, (2001).
16. Zaumseil, P. "On the increased sensitivity of x-ray rocking curve measurements by triple crystal diffractometry," Phys. Stat. Sol.(a) , 91, K31-K33. (1985).
17. Fewster, P. F., "X-ray analysis of thin films and multilayers," Rep. Prog. Phys. 59, 1339-1407, (1996).
18. Takagi, S., "Dynamical theory of diffraction applicable to crystals with any kind of small distortion," Acta Cryst. 15, 1311-1312 (1962).