X-ray analysis of thin films and multilayers

Reports on Progress in Physics

Volumn 59, Issue 11, 1996, Pages 1339-1407

  Fewster, Paul F ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001368854     PISSN: 00344885     EISSN: None     Source Type: Journal    
DOI: 10.1088/0034-4885/59/11/001     Document Type: Article

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