Instrumental origin effects in triple-axis diffraction

Journal of Physics D: Applied Physics

Volumn 34, Issue 10 SPEC. ISS. A, 2001, Pages

  Gartstein, E ^a   Mandelbrot, M ^a   Mogilyanski, D ^a  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIFFRACTOMETERS; GRAPHIC METHODS; INTEGRATION; MATHEMATICAL MODELS; MONOCHROMATORS; OPTICAL RESOLVING POWER; REFLECTION; WAVELENGTH DISPERSIVE SPECTROSCOPY; X RAY DIFFRACTION ANALYSIS;

INTENSITY MAPS; PERFECT CRYSTALS; REFLECTION ANALYSER OPTICS;

CRYSTAL MICROSTRUCTURE;

EID: 0035926744     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/34/10a/313     Document Type: Article

References (11)

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