Integrated setup for the fabrication and measurement of magnetoresistive nanoconstrictions in ultrahigh vacuum

Review of Scientific Instruments

Volumn 79, Issue 10, 2008, Pages

  Stickler, Daniel ^a   Frömter, Robert ^a   Li, Wei ^a,b   Kobs, Andŕ ^a   Oepen, Hans Peter ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

^b UNIVERSITY OF BRITISH COLUMBIA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC RESISTANCE; ION BOMBARDMENT; MAGNETOELECTRONICS; MAGNETORESISTANCE; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; THICK FILMS; ULTRAHIGH VACUUM; VACUUM;

DAMAGE-FREE; HIGH SENSITIVITIES; IN SITU INVESTIGATIONS; IN-SITU; MAGNETIC NANOSTRUCTURES; MAGNETORESISTANCE MEASUREMENTS; MAGNETORESISTIVE; NANOCONSTRICTIONS; NAVIGATION AND CONTROLS; PERMALLOY FILMS; SCANNING ELECTRON MICROSCOPES; SET-UPS; SHAPE AND SIZES;

MAGNETIC FIELD EFFECTS;

EID: 55349140391     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2981693     Document Type: Conference Paper

References (36)

1. C. Chappert, A. Fert, and F. N. Van Dau, Nat. Mater. 1476-1122 10.1038/nmat2024 6, 813 (2007).
2. H. Coufal, L. Dhar, and C. D. Mee, MRS Bull. 31, 294 (2006).
3. C. H. Marrows, Adv. Phys. 0001-8732 10.1080/00018730500442209 54, 585 (2005).
4. S. A. Wolf, D. D. Awschalom, R. A. Buhrman, J. M. Daughton, S. von Molnar, M. L. Roukes, A. Y. Chtchelkanova, and D. M. Treger, Science 0036-8075 10.1126/science.1065389 294, 1488 (2001).
5. G. A. Prinz, Science 0036-8075 10.1126/science.282.5394.1660 282, 1660 (1998).
6. A. D. Kent, J. Yu, U. R. Rüdiger, and S. S. P. Parkin, J. Phys.: Condens. Matter 0953-8984 10.1088/0953-8984/13/25/202 13, R461 (2001).
7. C. Hassel, M. Brands, F. Y. Lo, A. D. Wieck, and G. Dumpich, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.97.226805 97, 226805 (2006).
8. K. I. Bolotin, F. Kuemmeth, A. N. Pasupathy, and D. C. Ralph, Nano Lett. 1530-6984 10.1021/nl0522936 6, 123 (2006).
9. U. Ebels, A. Radulescu, Y. Henry, L. Piraux, and K. Ounadjela, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.84.983 84, 983 (2000).
10. C. A. Volkert and A. M. Minor, MRS Bull. 32, 389 (2007). 0883-7694
11. J. Orloff and M. Utlaut, High Resolution Focused Ion Beams: FIB and its Applications (Kluwer, Dordrecht, 2002).
12. J. Orloff, Rev. Sci. Instrum. 0034-6748 10.1063/1.1144104 64, 1105 (1993).
13. L. A. Giannuzzi and F. A. Stevie, Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques, and Practice (Springer, Berlin, 2005).
14. S. Khizroev and D. Litvinov, Nanotechnology 0957-4484 10.1088/0957-4484/15/3/R01 15, R7 (2004).
15. D. Morecroft, J. L. Prieto, C. W. Leung, G. Burnell, M. G. Blamire, and D. B. Jardine, J. Appl. Phys. 0021-8979 10.1063/1.1451889 91, 8575 (2002).
16. Y. Ohsawa, J. Magn. Magn. Mater. 0304-8853 10.1016/j.jmmm.2004.10.081 287, 491 (2005).
17. T. Ono, H. Miyajima, K. Shigeto, K. Mibu, N. Hosoito, and T. Shinjo, Science 0036-8075 10.1126/science.284.5413.468 284, 468 (1999).
18. M. Brands and G. Dumpich, J. Appl. Phys. 0021-8979 10.1063/1.1938268 98, 014309 (2005).
19. M. Kläui, C. A. F. Vaz, J. A. C. Bland, W. Wernsdorfer, G. Faini, E. Cambril, L. J. Heyderman, F. Nolting, and U. Rüdiger, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.94.106601 94, 106601 (2005).
20. U. Ruediger, J. Yu, S. Zhang, A. D. Kent, and S. S. P. Parkin, Phys. Rev. Lett. 80, 5639 (1998).
21. U. Rüdiger, J. Yu, L. Thomas, S. S. P. Parkin, and A. D. Kent, Phys. Rev. B 0163-1829 10.1103/PhysRevB.59.11914 59, 11914 (1999).
22. C. Hassel, F. M. Römer, R. Meckenstock, G. Dumpich, and J. Linder, Phys. Rev. B 0163-1829 10.1103/PhysRevB.77.224439 77, 224439 (2008).
23. CANION 31 Plus, Orsay Physics, www.orsayphysics.com
24. Stripped column from a JAMP-30 Auger-Microprobe, JEOL Ltd., www.jeol.com
25. AP-81030, JEOL Ltd.
26. ELPHY Quantum, Raith GmbH, www.raith.com.
27. MM3A-EM UHV, kleindiek nanotechnik, www.nanotechnik.com.
28. L. M. Peng, Q. Chen, X. L. Liang, S. Gao, J. Y. Wang, S. Kleindiek, and S. W. Tai, Micron 0968-4328 10.1016/j.micron.2003.12.005 35, 495 (2004).
29. S. Hasegawa, N. Sato, I. Shiraki, C. L. Petersen, P. Bøggild, T. M. Hansen, T. Nagao, and F. Grey, Jpn. J. Appl. Phys., Part 1 0021-4922 10.1143/JJAP.39.3815 39, 3815 (2000).
30. Models 6221/2182A Delta Mode system, Keithley Instruments Inc., www.keithley.com.
31. K. Shigeto, T. Shinjo, and T. Ono, Appl. Phys. Lett. 0003-6951 10.1063/1.125159 75, 2815 (1999).
32. R. P. Cowburn, D. A. Allwood, G. Xiong, and M. D. Cooke, J. Appl. Phys. 0021-8979 10.1063/1.1447500 91, 6949 (2002).
33. M. Brands and G. Dumpich, J. Phys.: Condens. Matter 38, 822 (2005). 0953-8984
34. T. R. McGuire and R. I. Potter, IEEE Trans. Magn. 0018-9464 10.1109/TMAG.1975.1058782 11, 1018 (1975).
35. W. Y. Lee, M. F. Toney, P. Tameerug, E. Allen, and D. Mauri, J. Appl. Phys. 0021-8979 10.1063/1.372908 87, 6992 (2000).
36. A. Yamaguchi, T. Ono, S. Nasu, K. Miyake, K. Mibu, and T. Shinjo, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.92.077205 92, 077205 (2004).