Electrical instability in vanadyl-phthalocyanine thin-film transistors

Applied Physics Letters

Volumn 93, Issue 17, 2008, Pages

  Wang, Lijuan ^a   Liu, Guojun ^a   Zhu, Feng ^b   Pan, Feng ^b   Yan, Donghang ^b  

^a CHANGCHUN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b CHANGCHUN INSTITUTE OF APPLIED CHEMISTRY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

FLAT PANEL DISPLAYS; SEMICONDUCTING ORGANIC COMPOUNDS; SILICON; THIN FILM DEVICES; THRESHOLD VOLTAGE; TRANSISTORS; VANADIUM COMPOUNDS;

BIAS STRESSES; DEGRADATION PROCESSES; ELECTRICAL INSTABILITIES; RAPID RECOVERIES; ROOM TEMPERATURES; STRETCHED EXPONENTIAL; VANADYL;

THIN FILM TRANSISTORS;

EID: 55149117114     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3009208     Document Type: Article

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