Writing nanotriboelectric charge bits on insulator surface

Applied Physics Letters

Volumn 93, Issue 17, 2008, Pages

  Son, J Y ^a   Lee, Geunhee ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

INSULATION; SILICON; THICK FILMS;

CONTACT FORCES; EXPERIMENTAL PARAMETERS; INSULATOR SURFACES; KELVIN PROBE FORCE MICROSCOPES; LINE WIDTHS; SI SUBSTRATES; SIO2 THIN FILMS;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 55149104824     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3010739     Document Type: Article

References (18)

1. F. P. Bowden and D. Tabor, The Friction and Lubrication of Solids (Clarendon, Oxford, 1986).
2. E. Fukada and J. F. Fowler, Nature (London) 0028-0836 10.1038/181693b0 181, 693 (1958).
3. J. Henniker, Nature (London) 0028-0836 10.1038/196474a0 196, 474 (1962).
4. A. D. Moore, Electrostatics (Doubleday, New York, 1968).
5. B. N. J. Persson, Sliding Friction (Springer, Berlin, 1998).
6. G. Binnig, C. F. Quate, and C. Gerber, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.56.930 56, 930 (1986).
7. G. Binning, H. Rohrer, C. Gerber, and E. Weibel, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.49.57 49, 57 (1982).
8. H. Dai, J. H. Hafner, A. G. Rinzler, D. T. Colbert, and R. E. Smalley, Nature (London) 0028-0836 10.1038/384147a0 384, 147 (1996).
9. G. H. Enevoldsen, T. Glatzel, M. C. Christensen, J. V. Lauritsen, and F. Besenbacher, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.100.236104 100, 236104 (2008).
10. K. Karrai and R. D. Grober, Appl. Phys. Lett. 0003-6951 10.1063/1.113340 66, 1842 (1995).
11. J. Y. Son, B. G. Kim, C. H. Kim, and J. H. Cho, Appl. Phys. Lett. 0003-6951 10.1063/1.1762974 84, 4971 (2004).
12. M. Yasutake, D. Aoki, and M. Fujihira, Thin Solid Films 0040-6090 10.1016/0040-6090(95)06772-8 273, 279 (1996).
13. M. H. Zhao, Z. L. Wang, and S. X. Mao, Nano Lett. 1530-6984 10.1021/nl035198a 4, 587 (2004).
14. B. E. Deal and A. S. Grove, J. Appl. Phys. 0021-8979 10.1063/1.1713945 36, 3770 (1965).
15. H. O. Jacobs, H. F. Knapp, and A. Stemmer, Rev. Sci. Instrum. 0034-6748 10.1063/1.1149664 70, 1756 (1999).
16. M. A. Salem, H. Mizuta, and S. Oda, Appl. Phys. Lett. 0003-6951 10.1063/1.1804250 85, 3262 (2004).
17. Z. A. Weinberg, G. W. Rubloff, and E. Bassous, Phys. Rev. B 0163-1829 10.1103/PhysRevB.19.3107 19, 3107 (1979).
18. G. L. Zhao and M. E. Bachlechner, Phys. Rev. B 0163-1829 10.1103/PhysRevB.58.1887 58, 1887 (1998).