Structural and optical properties of ZrB2 and HfxZr1-xB2 films grown by vicinal surface epitaxy on Si(1 1 1) substrates

Solid-State Electronics

Volumn 52, Issue 11, 2008, Pages 1687-1690

  Roucka, R ^a   An, Y J ^a   Chizmeshya, A V G ^a   D'Costa, V R ^a   Tolle, J ^a   Menendez J ^a   Kouvetakis, J ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Diborides nitride epitaxy silicon substrate

Indexed keywords

EID: 55049132731     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2008.07.013     Document Type: Letter

References (16)

1. Humphreys C.J. MRS Bulletin 33 (2008) 459
2. Krost A.D.A. Phys Stat Sol (A) 194/2 (2002) 361
3. Hu C.-H., Chizmeshya A.V.G., Tolle J., Kouvetakis J., and Tsong I.S.T. J Cryst Growth 267/3-4 (2004) 554
4. Tolle J., Kouvetakis J., Kim D.-W., Mahajan S., Bell A., Ponce F.A., et al. Appl Phys Lett 84/18 (2004) 3510
5. Roucka R., An Y., Chizmeshya A.V.G., Tolle J., Kouvetakis J., D'Costa V.R., et al. Appl Phys Lett 89/24 (2006) 242110
6. Roucka R., D'Costa V.R., An Y.J., Canonico M., Kouvetakis J., Menéndez J., et al. Chem Mater 20/4 (2008) 1431
7. Yamada-Takamura Y., Wang Z.T., Fujikawa Y., Sakurai T., Xue Q.K., Tolle J., et al. Phys Rev Lett 95/26 (2005) 266105
8. Huang X.R., Bai J., Dudley M., Wagner B., Davis R.F., and Zhu Y. Phys Rev Lett 95/8 (2005) 086101
9. Kaeding J.F., Iza M., Sato H., DenBaars S.P., Speck J.S., and Nakamura S. Jpn J Appl Phys 45/21 (2006) L536
10. Barabash R.I., Ice G.E., Roder C., Budai J., Liu W., Figge S., et al. Phys Stat Sol (B) 244/5 (2007) 1735
11. Nagai H. J Appl Phys 45/9 (1974) 3789
12. Herzinger C.M., Johs B., McGahan W.A., Woollam J.A., and Paulson W. J Appl Phys 83/6 (1998) 3323
13. Tiwald T.E., Thompson D.W., and Woollam J.A. AVS (1998) 312
14. Bohren C.F., and Huffman D.R. Absorption and Scattering of Light by Small Particles (1983), Wiley Interscience, New York
15. Koh J., Lu Y., Wronski C.R., Kuang Y., Collins R.W., Tsong T.T., et al. Appl Phys Lett 69/9 (1996) 1297
16. McGahan W.A., Johs B., and Woollam J.A. Thin Solid Films 234/1-2 (1993) 443