Synthesis and characterization of ferroelectric properties of Ce2Ti2O7 thin films with Ce3+ by chemical solution deposition

Thin Solid Films

Volumn 517, Issue 2, 2008, Pages 506-509

  Kim, Woo Sik ^a   Yang, Jun Kyu ^a   Lee, Chang Ki ^a   Lee, Hong Sub ^a   Park, Hyung Ho ^a  

^a Yonsei University   (South Korea)

Author keywords

Cerium titanate; Ferroelectric properties; Non volatile memory; Pseudo pyrochlore phase; X ray absorption near edge structure; X ray diffraction

Indexed keywords

ABSORPTION; ANNEALING; CAPACITANCE; CERAMIC CAPACITORS; CERIUM COMPOUNDS; CHEMICALS; DIELECTRIC DEVICES; DIELECTRIC LOSSES; ELECTROMAGNETIC WAVE ABSORPTION; ENERGY ABSORPTION; FERROELECTRICITY; PLATINUM; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SILICON COMPOUNDS; THICK FILMS; VACUUM; VACUUM DEPOSITION; X RAY ABSORPTION; X RAY ANALYSIS;

FERROELECTRIC PROPERTIES; NON-VOLATILE MEMORY; PSEUDO-PYROCHLORE PHASE; X-RAY ABSORPTION NEAR EDGE STRUCTURE; X-RAY DIFFRACTION;

CERIUM;

EID: 55049095129     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.06.058     Document Type: Article

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