Narrow-band photodetection based on M-plane GaN films

Physica Status Solidi (A) Applications and Materials Science

Volumn 205, Issue 5, 2008, Pages 1100-1102

  Ghosh, Sandip ^a   Rivera, C ^b   Pau, J L ^b   Munoz E ^b   Brandt, O ^c   Grahn, H T ^c  

^a TATA INSTITUTE OF FUNDAMENTAL RESEARCH   (India)

^b UNIVERSIDAD POLITÉCNICA DE MADRID   (Spain)

^c PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AIRBORNE; BIOLOGICAL AND CHEMICAL AGENTS; C -AXIS; DETECTION SYSTEMS; FILM PLANES; GAN FILMS; HAZARDOUS; INCIDENT LIGHT; LINEAR POLARIZATIONS; M-PLANE; MOLECULAR-BEAM EPITAXIES; OPTICAL BANDS; ORTHOGONAL ALIGNMENTS; PEAK RESPONSIVITY; RAPID IDENTIFICATIONS; SCHOTTKY PHOTODETECTORS; SIMULTANEOUS DETECTIONS; SPECTRAL RESPONSIVITY; ULTRA-VIOLET;

BANDWIDTH; CRYSTAL GROWTH; GALLIUM ALLOYS; GALLIUM NITRIDE; OPTOELECTRONIC DEVICES; POLARIZATION; SEMICONDUCTING GALLIUM; STEREOCHEMISTRY; TELECOMMUNICATION SYSTEMS; WAVE FILTERS;

PHOTODETECTORS;

EID: 54849433444     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200778650     Document Type: Article

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