AlGaN-based ultraviolet light detectors with integrated optical filters

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 18, Issue 2, 2000, Pages 757-760

  Karrer, Uwe ^a   Dobner, Armin ^a   Ambacher, Oliver ^a   Stutzmann, Martin ^a  

^a WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ALLOYS; FILM GROWTH; INTEGRATED OPTOELECTRONICS; MOLECULAR BEAM EPITAXY; OPTICAL FILTERS; SPECTRUM ANALYSIS;

PHOTOCURRENT DECAY;

ULTRAVIOLET DETECTORS;

EID: 0034155771     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.591272     Document Type: Article

References (0)