Nanomechanical measurements on polymers using contact mode atomic force microscopy

Thin Solid Films

Volumn 339, Issue 1-2, 1999, Pages 258-264

  Lemoine, P ^a   Mc Laughlin, J ^a  

^a UNIVERSITY OF ULSTER   (United Kingdom)

Author keywords

Atomic force microscopy; Hardness; Polymers; Surface morphology

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTINUUM MECHANICS; HARDNESS; MECHANICAL TESTING; MORPHOLOGY; PLASTIC DEFORMATION; SILICON; SURFACE PROPERTIES; WEAR OF MATERIALS;

CONTACT MODE ATOMIC FORCE MICROSCOPY; NANOMECHANICAL PROPERTIES;

PLASTIC FILMS;

EID: 0033534949     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01230-9     Document Type: Article

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