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Volumn 79, Issue 5, 2004, Pages 603-609

A study of the degradation of poly(3-octylthiophene)-based light emitting diodes by Surface Enhanced Raman Scattering

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ANALYSIS; ATOMIC FORCE MICROSCOPY; BUBBLE FORMATION; DEGRADATION; ELECTROMAGNETISM; RAMAN SCATTERING; REDUCTION; SURFACE ROUGHNESS;

EID: 5444227685     PISSN: 09462171     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00340-004-1592-5     Document Type: Article
Times cited : (18)

References (30)
  • 1
    • 21544459113 scopus 로고
    • C.W. Tang, S.A. VanSlyke: Appl. Phys. Lett. 51, 913 (1987); J.H. Burroughes, D.D.C. Bradley, A.R. Brown, R.N. Marks, K. Mackey, R.H. Friend, P.L. Burns, A.B. Holmes: Nature 347, 539 (1990); U. Mitschke, P. Bäuerle: J. Mater. Chem. 10, 1471 (2000)
    • (1987) Appl. Phys. Lett. , vol.51 , pp. 913
    • Tang, C.W.1    Vanslyke, S.A.2
  • 3
    • 0033927513 scopus 로고    scopus 로고
    • C.W. Tang, S.A. VanSlyke: Appl. Phys. Lett. 51, 913 (1987); J.H. Burroughes, D.D.C. Bradley, A.R. Brown, R.N. Marks, K. Mackey, R.H. Friend, P.L. Burns, A.B. Holmes: Nature 347, 539 (1990); U. Mitschke, P. Bäuerle: J. Mater. Chem. 10, 1471 (2000)
    • (2000) J. Mater. Chem. , vol.10 , pp. 1471
    • Mitschke, U.1    Bäuerle, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.