Degradation and failure of organic light-emitting devices

Applied Physics Letters

Volumn 80, Issue 12, 2002, Pages 2195-2197

  Ke, Lin ^a   Chua, Soo Jin ^a   Zhang, Keran ^a   Yakovlev, Nikolai ^a  

^a INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CENTRAL CORE; CURRENT STRESS; DARK SPOTS; DEVICE CURRENTS; EMITTING AREAS; INDIUM TIN OXIDE; METAL MIGRATIONS; OPEN CIRCUITS; ORGANIC LIGHT-EMITTING DEVICES; SECONDARY ION MASS SPECTROMETRY PROFILES;

CURRENT DENSITY; LIGHT EMISSION; OPTICAL MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; TIN; TIN OXIDES;

DEGRADATION;

EID: 79955988118     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1464216     Document Type: Article

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