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Volumn 91, Issue 1-3, 1997, Pages 113-116

Nuclei of dark spots in organic EL devices: Detection by DFM and observation of the microstructure by TEM

Author keywords

Dark field microscopy; Electroluminescence; Microstructures; Organic devices; Transmission electron microscopy

Indexed keywords

ALUMINUM; AUGER ELECTRON SPECTROSCOPY; CATHODES; ELECTROLUMINESCENCE; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

DARK FIELD MICROSCOPY (DFM); DARK SPOTS; SCANNING ION MICROSCOPY (SIM);

LUMINESCENT DEVICES;

EID: 0031352156 PISSN: 03796779 EISSN: None Source Type: Journal
DOI: 10.1016/s0379-6779(97)03989-1 Document Type: Article

Times cited : (49)

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