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Journal of Materials Chemistry

Volumn 18, Issue 42, 2008, Pages 5092-5097

Photochemical surface modification and characterization of double-decker-shaped polysilsesquioxane hybrid thin films

(3) Aminuzzaman, Mohammod a Watanabe, Akira a Miyashita, Tokuji a

a TOHOKU UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; AIRCRAFT; ANGLE MEASUREMENT; ATOMIC SPECTROSCOPY; CHEMICAL MODIFICATION; CONTACT ANGLE; CRYSTAL ATOMIC STRUCTURE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FOURIER TRANSFORMS; INFRARED SPECTROSCOPY; IRRADIATION; NANOSTRUCTURED MATERIALS; NETWORK PROTOCOLS; OXYGEN; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SENSOR NETWORKS; SILICON; SILICON COMPOUNDS; SPECTROSCOPIC ANALYSIS; SPECTRUM ANALYSIS; SURFACE STRUCTURE; SURFACE TREATMENT; THICK FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

AG NANOPARTICLES; ATMOSPHERIC OXYGENS; ATOMIC FORCES; DEEP ULTRAVIOLETS; DEEP-UV; FILM SURFACES; FOURIER TRANSFORM INFRARED; HYBRID FILMS; HYBRID THIN FILMS; HYDROPHILIC; HYDROPHOBIC; MICROPATTERNS; NETWORK STRUCTURES; PHOTOCHEMICAL SURFACE MODIFICATIONS; POLYSILSESQUIOXANE; ROOM TEMPERATURES; SCOTCH TAPE TESTS; SI CAGES; SILANOL GROUPS; SURFACE MODIFICATIONS; X-RAY PHOTOELECTRON SPECTROSCOPIES;

SILVER;

EID: 54249129731 PISSN: 09599428 EISSN: 13645501 Source Type: Journal
DOI: 10.1039/b809819k Document Type: Article

Times cited : (43)

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