Microstructures and fatigue-free properties of the La3+ and Nd3+ doped Bi4Ti3O12 thin films prepared by modified sol-gel technique

Science in China, Series E: Technological Sciences

Volumn 51, Issue 11, 2008, Pages 1843-1849

  Li, MeiYa ^a   Pei, Ling ^a   Liu, Jun ^a   Yu, BenFang ^a   Guo, DongYun ^a   Sun, XiaoHua ^b   Zhao, XingZhong ^a  

^a WUHAN UNIVERSITY   (China)

^b CHINA THREE GORGES UNIVERSITY   (China)

Author keywords

Bismuth oxides; Fatigue; Ferroelectrics; Sol gel technique

Indexed keywords

BISMUTH; CAPACITANCE; CAPACITORS; COLLOIDS; DIELECTRIC DEVICES; ELECTRIC EQUIPMENT; ELECTROLYTIC CAPACITORS; FERROELECTRIC FILMS; FERROELECTRIC MATERIALS; FERROELECTRICITY; GELATION; GELS; HYSTERESIS; HYSTERESIS LOOPS; LANTHANUM; MAGNETIC MATERIALS; NEODYMIUM; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SILICON COMPOUNDS; SOL-GEL PROCESS; SOL-GELS; SOLS; THICK FILMS; THIN FILMS;

APPLIED VOLTAGES; BISMUTH OXIDES; COERCIVE FIELDS; DENSE FILMS; DOPING; FATIGUE; FATIGUE BEHAVIORS; FERROELECTRICS; FREE PROPERTIES; GRAIN SIZES; METAL TYPES; POLYCRYSTALLINE; REMANENT POLARIZATIONS; SATURATED HYSTERESIS LOOPS; SCANNING ELECTRON MICROSCOPES; SI (100) SUBSTRATES; SOL-GEL TECHNIQUE; SWITCHING CYCLES; TEST FREQUENCIES; X-RAY DIFFRACTIONS;

COPPER;

EID: 54149119124     PISSN: 10069321     EISSN: 1862281X     Source Type: Journal    
DOI: 10.1007/s11431-008-0120-y     Document Type: Article

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