Electrical properties of Nd-substituted Bi4Ti3O 12 thin films fabricated by chemical solution deposition

Journal of Crystal Growth

Volumn 277, Issue 1-4, 2005, Pages 233-237

  Zhong, X L ^a   Wang, J B ^a   Zhou, Y C ^a   Liu, J J ^a   Zheng, X J ^a  

^a XIANGTAN UNIVERSITY   (China)

Author keywords

BNT thin films; Chemical solution deposition; Ferroelectric material

Indexed keywords

ANNEALING; CRYSTALLIZATION; ELECTRIC PROPERTIES; FERROELECTRIC MATERIALS; FERROELECTRIC THIN FILMS; NEODYMIUM; PERMITTIVITY; POLARIZATION; SCANNING ELECTRON MICROSCOPY; SPIN COATING; X RAY DIFFRACTION;

BISMUTH NITRATE; CHEMICAL SOLUTION DEPOSITION (CSD); CROSS-SECTION MORPHOLOGY; ND SUBSTITUTED BI4TI3O12 (BNT) THIN FILMS;

BISMUTH COMPOUNDS;

EID: 15844413370     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.12.140     Document Type: Article

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