Effects of niobium doping on microstructures and ferroelectric properties of bismuth titanate ferroelectric thin films

Thin Solid Films

Volumn 419, Issue 1-2, 2002, Pages 225-229

  Kim, Jong Kuk ^a   Kim, Jinheung ^a   Song, Tae Kwon ^a   Kim, Sang Su ^a  

^a Changwon National University   (South Korea)

Author keywords

Capacitors; Ferroelectric properties; Scanning electron microscopy; X ray diffraction

Indexed keywords

BISMUTH COMPOUNDS; CAPACITORS; COERCIVE FORCE; DOPING (ADDITIVES); GRAIN SIZE AND SHAPE; MICROSTRUCTURE; NIOBIUM; SCANNING ELECTRON MICROSCOPY; SOL-GELS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

REMANENT POLARIZATION;

FERROELECTRIC THIN FILMS;

EID: 0036848980     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)00550-3     Document Type: Article

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