Focused ion beam milled CoPt magnetic force microscopy tips for high resolution domain images

IEEE Transactions on Magnetics

Volumn 40, Issue 4 II, 2004, Pages 2194-2196

  Gao, L ^a   Yue, L P ^a   Yokota, T ^a   Skomski, R ^a   Liou, S H ^a   Takahoshi, H ^b   Saito, H ^b   Ishio, S ^b  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^b AKITA UNIVERSITY   (Japan)

Author keywords

Domain images; Focused ion beam technology; Magnetic force microscopy; Magnetic recording

Indexed keywords

COERCIVE FORCE; FOURIER TRANSFORMS; FREQUENCIES; IMAGE ANALYSIS; ION BEAMS; MAGNETIC DOMAINS; MAGNETIC FLUX; MAGNETIC MATERIALS; MAGNETIC RECORDING; MAGNETIZATION;

DOMAIN IMAGES; FOCUSED ION BEAM TECHNOLOGY; MAGNETIC FORCE MICROSCOPY;

MICROSCOPIC EXAMINATION;

EID: 4444305411     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2004.829173     Document Type: Article

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