Electrochemical fabrication of cobalt and nickel tips for scanning tunneling microscopy

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 23, Issue 6, 2005, Pages 2564-2566

  Albonetti, Cristiano ^a   Cavallini, Massimiliano ^a   Massi, Massimiliano ^a   Moulin, Jean Fraņois ^a   Biscarini, Fabio ^a  

^a CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMISTRY; NICKEL; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

AMBIENT CONDITIONS; CONDUCTIVE TIPS;

COBALT;

EID: 29044436833     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2131873     Document Type: Article

References (12)

1. A. J. Nam, A. Teren T. A. Lusby, and A. J. Melmed, J. Vac. Sci. Technol. B 13, 1556 (1995).
2. M. Fotino, Rev. Sci. Instrum. 64, 159 (1993).
3. A.-D. Müller, F. Müller, M Hietschold, F. Demming, J. Jerrsch, and K. Dickmann, Rev. Sci. Instrum. 70, 3970 (1999).
4. I. Ekvall, E. Wahlström, D. Claesson, H. Olin, and E. Olsson, Meas. Sci. Technol. 10, 11 (1999).
5. H. Bourque and R. M. Leblanc, Rev. Sci. Instrum. 66, 2695 (1995).
6. Y. Cohen and D. Aurbach, Rev. Sci. Instrum. 70, 4668 (1999).
7. R. Weisendanger, D. Bürgler, G. Tarrach, T. Schaub, U. Hartmann, H. J. Güntherodt, I. V. Shvets, and J. M. Coey, Appl. Phys. A 53, 349 (1991).
8. A. Kubetzka, M. Bode, O. Pietzsch, and R. Weisendanger, Phys. Rev. Lett. 88, 57201 (1991).
9. M. Bode, M. Getzlaff, and R. Weisendanger, Phys. Rev. Lett. 81, 4256 (1998).
10. R. Weisendanger, H. J. Güntherodt, G. Güntherodt, R. J. Gambino, and R. Ruf, Phys. Rev. Lett. 65, 247 (1990).
11. S. F. Alvarado, Phys. Rev. Lett. 75, 513 (1995).
12. R. Mersevey and P. M. Tedrow, Phys. Rep. 238, 173 (1994).