Stress-based and path-based fault injection

IEEE Transactions on Computers

Volumn 48, Issue 11, 1999, Pages 1183-1201

  Tsai, Timothy K ^a,b   Hsueh, Mei Chen ^c   Zhao, Hong ^d   Kalbarczyk, Zbigniew ^a,e   Iyer, Ravishankar K ^a,e  

^a IEEE   (United States)

^b LUCENT TECHNOLOGIES   (United States)

^c Ascend Communications Corporation

^d AVX CORPORATION   (United States)

^e University of Illinois at Urbana Champaign   (United States)

Author keywords

Dependability; Fault injection; Fault tolerance; Path based; Program flow; Stress based; Workload

Indexed keywords

COMPUTER SYSTEM RECOVERY; COMPUTER SYSTEMS PROGRAMMING; DATA FLOW ANALYSIS; RESPONSE TIME (COMPUTER SYSTEMS);

PATH-BASED FAULT INJECTION; STRESS-BASED FAULT INJECTION;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 0033220884     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.811108     Document Type: Article

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