Strain state, microstructure and electrical transport properties of LaNiO3 films grown on Si substrates

Journal of Physics D: Applied Physics

Volumn 41, Issue 19, 2008, Pages

  Qiao, L ^a   Bi, X F ^a  

^a BEIHANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL TRANSPORT PROPERTIES; STRAIN STATES;

TRANSPORT PROPERTIES;

EID: 53349101535     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/41/19/195407     Document Type: Article

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