Radiation test challenges for scaled commercial memories

IEEE Transactions on Nuclear Science

Volumn 55, Issue 4, 2008, Pages 2174-2180

  LaBel, Kenneth A ^a   Ladbury, Ray L ^a   Cohn, Lewis M ^b   Oldham, Timothy R ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b DEFENSE THREAT REDUCTION AGENCY   (United States)

Author keywords

CMOS; Commercial memories; Radiation effects

Indexed keywords

DATA STORAGE EQUIPMENT; FAILURE ANALYSIS; RANDOM ACCESS STORAGE;

BIT DENSITY; CMOS; CMOS TECHNOLOGIES; COMMERCIAL MEMORIES; DYNAMIC RANDOM ACCESS MEMORIES; NON-VOLATILE MEMORIES; RADIATION TESTING; SPACE ENVIRONMENTS; SUB-100 NM;

RADIATION EFFECTS;

EID: 53349099246     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2008.2001481     Document Type: Conference Paper

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