Static and dynamic analysis of SEU effects in SRAM-based FPGAs

Proceedings - 12th IEEE European Test Symposium, ETS 2007

Volumn , Issue , 2007, Pages 159-164

  Sterpone, L ^a   Violante, M ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE EQUIPMENT; NETWORKS (CIRCUITS); SENSITIVITY ANALYSIS; STATIC ANALYSIS; STATIC RANDOM ACCESS STORAGE;

CIRCUIT FPGA DEVICES; SEU EFFECTS; SINGLE EVENT UPSETS (SEU); SRAM-BASED FPGA;

FIELD PROGRAMMABLE GATE ARRAYS (FPGA);

EID: 34548728657     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETS.2007.37     Document Type: Conference Paper

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