Metrics for architecture-level lifetime reliability analysis

ISPASS 2008 - IEEE International Symposium on Performance Analysis of Systems and Software

Volumn , Issue , 2008, Pages 202-212

  Ramachandran, Pradeep ^a   Adve, Sarita V ^a   Bose, Pradip ^b   Rivers, Jude A ^b  

^a University of Illinois at Urbana Champaign   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMMODITY PROCESSORS; END USERS; IN-DEPTH ANALYSIS; INTERNATIONAL SYMPOSIUM; LIFETIME RELIABILITY; MEAN-TIME-TO-FAILURE; OPERATIONAL LIFE; OPTIMAL DESIGNS; PERFORMANCE ANALYSES; RELIABILITY CHARACTERISTICS; RELIABILITY-AWARE DESIGN; SUB-OPTIMAL DESIGNS; SUPERSCALAR PROCESSORS; SYSTEMS-AND-SOFTWARE; TIME-TO-FAILURE;

OPTIMAL SYSTEMS; OPTIMIZATION; QUALITY ASSURANCE; RELIABILITY; TECHNICAL PRESENTATIONS;

RELIABILITY ANALYSIS;

EID: 52249092623     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISPASS.2008.4510752     Document Type: Conference Paper

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