Thermal conductance measurements for the development of ultra low-noise Transition-Edge Sensors with a new method for measuring the Noise Equivalent Power

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7020, Issue , 2008, Pages

  Rostem, Karwan ^a   Glowacka, Dorota M ^a   Goldie, David J ^a   Withington, Stafford ^a  

^a Optoelectronics Group   (United Kingdom)

Author keywords

Johnson noise thermometry; On chip black body source; Thermal properties of SixNy; Transition Edge Sensors

Indexed keywords

ACCURATE MEASUREMENTS; CONDUCTANCE MEASUREMENTS; GROUND-BASED; JOHNSON NOISE THERMOMETRY; LOW-NOISE; NOISE-EQUIVALENT POWER; ON-CHIP BLACK-BODY SOURCE; SPACE ASTRONOMY; SUB-MILLIMETER; THERMAL PROPERTIES OF SIXNY; TRANSITION-EDGE-SENSORS;

ASTROPHYSICS; INSTRUMENTS; NANOSENSORS; SENSORS; SILICON;

ASTRONOMY;

EID: 52249086067     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.787372     Document Type: Conference Paper

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