Technique for measuring the conductance of silicon-nitride membranes using Johnson Noise thermometry

Journal of Low Temperature Physics

Volumn 151, Issue 1-2 PART 1, 2008, Pages 76-81

  Rostem, Ka ^a   Glowacka, D ^a   Goldie, D J ^a   Withington, S ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Johnson noise thermometry; Silicon nitride; Thermal conductance measurements

Indexed keywords

RESISTORS; SILICON NITRIDE; SQUIDS; THERMAL CONDUCTIVITY; THERMAL LOAD;

JOHNSON NOISE THERMOMETRY; THERMAL CONDUCTANCE MEASUREMENTS;

THERMOMETERS;

EID: 40649092038     PISSN: 00222291     EISSN: 15737357     Source Type: Journal    
DOI: 10.1007/s10909-007-9701-6     Document Type: Article

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