In-plane band gap modulation investigated by secondary electron imaging of GaAsN/GaAsN:H heterostructures

Applied Physics Letters

Volumn 93, Issue 10, 2008, Pages

  Felisari, L ^a   Grillo, V ^a   Martelli, F ^a   Trotta, R ^b   Polimeni, A ^b   Capizzi, M ^b   Jabeen, F ^a,c   Mariucci, L ^d  

^a LABORATORIO TASC   (Italy)

^b UNIVERSITÀ DI ROMA LA SAPIENZA   (Italy)

^c SINCROTRONE TRIESTE   (Italy)

^d CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EMISSION SPECTROSCOPY; ENERGY GAP; GALLIUM ALLOYS; MASS SPECTROMETRY; MODULATION; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SPONTANEOUS EMISSION;

HETEROSTRUCTURES; IN-PLANE;

SECONDARY EMISSION;

EID: 51749108400     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2981689     Document Type: Article

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