-
1
-
-
0037204020
-
Scanning microscopic four-point conductivity probes
-
Petersen C L, Hansen T M, Bøggild P, Boisen A, Hansen O and Grey F 2002 Scanning microscopic four-point conductivity probes Sensors Actuators A 96 53-8
-
(2002)
Sensors Actuators
, vol.96
, Issue.1
, pp. 53-58
-
-
Petersen, C.L.1
Hansen, T.M.2
Bøggild, P.3
Boisen, A.4
Hansen, O.5
Grey, F.6
-
2
-
-
0034225737
-
Direct measurement of the microscale conductivity of conjugated polymer monolayers
-
Bøggild P, Grey F, Hassenkam T, Greve D R and Bjørnholm T 2000 Direct measurement of the microscale conductivity of conjugated polymer monolayers Adv. Mater. 12 947
-
(2000)
Adv. Mater.
, vol.12
, Issue.13
, pp. 947
-
-
Bøggild, P.1
Grey, F.2
Hassenkam, T.3
Greve, D.R.4
Bjørnholm, T.5
-
3
-
-
33646541683
-
Direct measurements of resistance of multiwalled Carbon nanotubes using micro four point probes
-
Dohn S, Mølhave K and Bøggild P 2005 Direct measurements of resistance of multiwalled Carbon nanotubes using micro four point probes Sensor Lett. 3 300-3
-
(2005)
Sensor Lett.
, vol.3
, Issue.4
, pp. 300-303
-
-
Dohn, S.1
Mølhave, K.2
Bøggild, P.3
-
4
-
-
0042341513
-
Magnetoresistance measurement of unpatterned magnetic tunnel junction wafers by current-in-plane tunneling
-
Worledge D C and Trouilloud P L 2003 Magnetoresistance measurement of unpatterned magnetic tunnel junction wafers by current-in-plane tunneling Appl. Phys. Lett. 81 84-6
-
(2003)
Appl. Phys. Lett.
, vol.81
, pp. 84-86
-
-
Worledge, D.C.1
Trouilloud, P.L.2
-
5
-
-
12144288890
-
Electrical conduction through surface superstructures measured by microscopic four-point probes
-
Hasegawa S et al 2003 Electrical conduction through surface superstructures measured by microscopic four-point probes Surf. Rev. Lett. 10 963-80
-
(2003)
Surf. Rev. Lett.
, vol.10
, Issue.6
, pp. 963-980
-
-
Hasegawa, S.1
Al, E.2
-
6
-
-
4944241508
-
Microcantilever equipped with nanowire template electrodes for multiprobe measurement on fragile nanostructures
-
Lin R, Boggild P and Hansen O 2004 Microcantilever equipped with nanowire template electrodes for multiprobe measurement on fragile nanostructures J. Appl. Phys. 96 2895-00
-
(2004)
J. Appl. Phys.
, vol.96
, Issue.5
, pp. 2895-2800
-
-
Lin, R.1
Boggild, P.2
Hansen, O.3
-
7
-
-
0141680590
-
Nano-four-point probes on microcantilever system fabricated by focused ion beam
-
Nagase M, Takahashi H, Shirakawabe Y and Namatsu H 2003 Nano-four-point probes on microcantilever system fabricated by focused ion beam Japan. J. Appl. Phys. 42 4856-60
-
(2003)
Japan. J. Appl. Phys.
, vol.42
, pp. 4856-4860
-
-
Nagase, M.1
Takahashi, H.2
Shirakawabe, Y.3
Namatsu, H.4
-
8
-
-
0038310911
-
Reproducibility of nano- and micro-scale multi-point probe sheet resistance measurements
-
Petersen C L, Worledge D and Petersen P R E 2003 Reproducibility of nano- and micro-scale multi-point probe sheet resistance measurements Proc. Material Research Society Symp. vol 738 pp 157-62
-
(2003)
Proc. Material Research Society Symp.
, vol.738
, pp. 157-162
-
-
Petersen, C.L.1
Worledge, D.2
Petersen, P.R.E.3
-
11
-
-
0030233248
-
Influence of substrates on the elastic reaction of films for the microindentation tests
-
Kim M T 1996 Influence of substrates on the elastic reaction of films for the microindentation tests Thin Solid Films 283 12-6
-
(1996)
Thin Solid Films
, vol.283
, Issue.1-2
, pp. 12-16
-
-
Kim, M.T.1
-
13
-
-
51649131402
-
-
Kjær D 2006 Optimization of micro-four point probes MSc Thesis MIC Technical University of Denmark
-
(2006)
MSc Thesis
-
-
Kjær, D.1
-
14
-
-
0042040751
-
2-laser micromachining and back-end processing for rapid production of PMMA-based microfluidic systems
-
2-laser micromachining and back-end processing for rapid production of PMMA-based microfluidic systems Lab Chip 2 242-6
-
(2002)
Lab Chip
, vol.2
, Issue.4
, pp. 242-246
-
-
Klank, H.1
Kutter, J.P.2
Geschke, O.3
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