Magnetoresistance measurement of unpatterned magnetic tunnel junction wafers by current-in-plane tunneling

Applied Physics Letters

Volumn 83, Issue 1, 2003, Pages 84-86

  Worledge, D C ^a   Trouilloud, P L ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETORESISTANCE; NONDESTRUCTIVE EXAMINATION; OPTIMIZATION; THERMODYNAMIC STABILITY;

CURRENT-IN-PLANE TUNNELING;

TUNNEL JUNCTIONS;

EID: 0042341513     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1590740     Document Type: Article

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