Neutron and alpha particle-induced transients in 90 NM technology

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2008, Pages 478-481

  Narasimham, Balaji ^a   Gadlage, Matthew J ^a   Bhuva, Bharat L ^a   Schrimpf, Ronald D ^a   Massengill, Lloyd W ^a   Timothy Holman, W ^a   Witulski, Arthur F ^a   Zhu, Xiaowei ^b   Balasubramanian, Anupama ^a   Wender, Steve A ^c  

^a VANDERBILT UNIVERSITY   (United States)

^b TEXAS INSTRUMENTS   (United States)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Alpha; Neutron; Pulse width; Single event; Single event transient (SET); Soft error; Soft error rate (SER)

Indexed keywords

ALPHA; NEUTRON; PULSE WIDTH; SINGLE EVENT; SINGLE EVENT TRANSIENT (SET); SOFT ERROR; SOFT ERROR RATE (SER);

ALPHA PARTICLES; CHARGED PARTICLES; COMPUTER NETWORKS; ERROR ANALYSIS; ERROR CORRECTION; MICROPROCESSOR CHIPS;

TRANSIENTS;

EID: 51549116312     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2008.4558932     Document Type: Conference Paper

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