Quantifying the effectiveness of guard bands in reducing the collected charge leading to soft errors

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2007, Pages 676-677

  Narasimham, B ^a   Shuler, R L ^b   Black, J D ^a   Bhuva, B L ^a   Schrimpf, R D ^a   Witulski, A F ^a   Holman, W T ^a   Massengill, L W ^a  

^a VANDERBILT UNIVERSITY   (United States)

^b NASA JOHNSON SPACE CENTER   (United States)

Author keywords

Guard bands; Pulse width; RHBD; SER; SET; Single event; Soft error

Indexed keywords

RADIATION HARDENING; RELIABILITY;

GUARD BANDS; SINGLE EVENT TRANSIENT (SET); SOFT ERROR RATE (SER);

INTEGRATED CIRCUITS;

EID: 34548800323     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2007.369565     Document Type: Conference Paper

References (7)

1. R. C. Baumann, "Single event effects in advanced CMOS Technology," in Proc. IEEE NSREC Short Course, 2005.
2. M. Nicolaidis and R. Perez, "Measuring the width of transient pulses induced by ionizing radiation," IEEE 41st IRPS proceedings, 2003.
3. P. Hazucha and C. Svensson, "Impact of CMOS Technology Scaling on the Atmospheric Neutron Soft Error Rate," IEEE TNS, Vol. 47, No. 6, pp. 2586-2594, Dec. 2000.
4. J. D. Black et al, "HBD layout isolation techniques for multiple node charge collection mitigation," IEEE TNS, vol. 52, p. 2536, Dec 2005.
5. B. Narasimham et al, "On-chip characterization of single event transient pulsewidths," IEEE TDMR., vol. 6, no. 4, p. 542, Dec 2006.
6. Cadence Spectre® Circuit Simulator User Guide, Sept. 2003.
7. P. Shivakumar et al, "Modeling the effect of technology trends on the soft error rate of combinational circuit," Proc. DSN, pp. 389,2002.