On the origins of sudden adhesion loss at a critical relative humidity: Examination of bulk and interfacial contributions

Langmuir

Volumn 24, Issue 17, 2008, Pages 9189-9193

  Tan, Kar Tean ^a   Vogt, Bryan D ^b   White, Christopher C ^a   Steffens, Kristen L ^a   Goldman, Joshua ^a   Satija, Sushil K ^a   Clerici, Cyril ^a   Hunston, Donald L ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b Arizona State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BULK WATER; CRITICAL RELATIVE HUMIDITY; INORGANIC SURFACES; POLY-METHYL METHACRYLATE;

ABS RESINS; ADHESION; ELECTRON BEAM LITHOGRAPHY; ESTERS; METEOROLOGY; MOISTURE; POLYMER FILMS; POLYMERIC GLASS;

ATMOSPHERIC HUMIDITY;

EID: 51449116783     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la800632r     Document Type: Article

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