In situ measurement of water at the organic coating/substrate interface

Progress in Organic Coatings

Volumn 27, Issue 1-4, 1996, Pages 181-193

  Nguyen, Tinh ^a   Byrd, Eric ^a   Bentz, Dale ^a   Lin, Changjian ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Organic coating substrate interface; Water measurement

Indexed keywords

CORROSION; DELAMINATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INTERFACES (MATERIALS); LIGHT REFLECTION; MATHEMATICAL MODELS; ORGANIC COATINGS; SUBSTRATES; THICKNESS MEASUREMENT; THIN FILMS; TRANSPORT PROPERTIES;

BLISTERING; ELECTRIC POTENTIALS; INTERNAL REFLECTION ELEMENT; MULTIPLE INTERNAL REFLECTION; WATER UPTAKE;

WATER;

EID: 0029778661     PISSN: 03009440     EISSN: None     Source Type: Journal    
DOI: 10.1016/0300-9440(95)00535-8     Document Type: Article

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