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Volumn , Issue , 2008, Pages 1601-1605

Fracture mechanics study of fatigue crack growth in solder joints under drop impact

Author keywords

[No Author keywords available]

Indexed keywords

CRACK FRONTS; SOLDER JOINTS;

EID: 51349151799     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2008.4550190     Document Type: Conference Paper
Times cited : (9)

References (14)
  • 2
    • 51349103564 scopus 로고    scopus 로고
    • JEDEC Standard JESD22-B111, Board Level Drop Test Method of Components for Handheld Electronic Products, July 2003, JEDEC Solid State Technology Association.
    • JEDEC Standard JESD22-B111, "Board Level Drop Test Method of Components for Handheld Electronic Products", July 2003, JEDEC Solid State Technology Association.
  • 6
    • 36348989735 scopus 로고    scopus 로고
    • Analytical Solutions for Interconnect Stress in Board Level Drop Impact
    • E.H. Wong, Y-W Mai, S.K.W Seah, K.M. Lim, T.B. Lim, "Analytical Solutions for Interconnect Stress in Board Level Drop Impact", IEEE Advanced Packaging, 2007, Vol. 30, No. 4, pp 654-664.
    • (2007) IEEE Advanced Packaging , vol.30 , Issue.4 , pp. 654-664
    • Wong, E.H.1    Mai, Y.-W.2    Seah, S.K.W.3    Lim, K.M.4    Lim, T.B.5
  • 7
    • 34250717016 scopus 로고    scopus 로고
    • Submodeling technique for BGA reliability analysis of CSP packaging subjected to an impact loading
    • L. Zhu, "Submodeling technique for BGA reliability analysis of CSP packaging subjected to an impact loading", Proc. InterPACK, 2001, IPACK2001-15873.
    • Proc. InterPACK, 2001, IPACK2001-15873
    • Zhu, L.1
  • 8
    • 27644445720 scopus 로고    scopus 로고
    • Modeling solder joint reliability of BGA packages subject to drop impact loading using submodeling
    • J. Wang, C. Hoe, E.H. Wong, "Modeling solder joint reliability of BGA packages subject to drop impact loading using submodeling", Proc. Abaqus Users' Conference, 2002.
    • (2002) Proc. Abaqus Users' Conference
    • Wang, J.1    Hoe, C.2    Wong, E.H.3
  • 9
    • 30844434820 scopus 로고    scopus 로고
    • Support excitation scheme for transient analysis of JEDEC board-level drop test
    • C.-L. Yeh, Y.-S. Lai, "Support excitation scheme for transient analysis of JEDEC board-level drop test", Microelectronics & Reliability, 2006, Vol. 46, pp. 626-636.
    • (2006) Microelectronics & Reliability , vol.46 , pp. 626-636
    • Yeh, C.-L.1    Lai, Y.-S.2
  • 10
    • 33645142768 scopus 로고    scopus 로고
    • Transient fracturing of solder joints subjected to displacement-controlled impact loads
    • C.-L. Yeh, Y.-S. Lai, "Transient fracturing of solder joints subjected to displacement-controlled impact loads", Microelectronics & Reliability, 2006, Vol. 46, pp. 885-895.
    • (2006) Microelectronics & Reliability , vol.46 , pp. 885-895
    • Yeh, C.-L.1    Lai, Y.-S.2
  • 12
    • 33845588989 scopus 로고    scopus 로고
    • P. Towashiraporn, C. Xie, Cohesive modeling of solder interconnect failure in board level drop test, 2006 ITHERM, pp. 817-825.
    • P. Towashiraporn, C. Xie, "Cohesive modeling of solder interconnect failure in board level drop test", 2006 ITHERM, pp. 817-825.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.