-
2
-
-
51349103564
-
-
JEDEC Standard JESD22-B111, Board Level Drop Test Method of Components for Handheld Electronic Products, July 2003, JEDEC Solid State Technology Association.
-
JEDEC Standard JESD22-B111, "Board Level Drop Test Method of Components for Handheld Electronic Products", July 2003, JEDEC Solid State Technology Association.
-
-
-
-
3
-
-
32844469702
-
Drop Impact Test - Mechanics and Physics of Failure
-
E.H. Wong, K.M. Lim, N. Lee, S. Seah, C. Koh, J. Wang, "Drop Impact Test - Mechanics and Physics of Failure", Proc. 4th Electronic Packaging Technology Conference, 2002, pp. 327-333.
-
(2002)
Proc. 4th Electronic Packaging Technology Conference
, pp. 327-333
-
-
Wong, E.H.1
Lim, K.M.2
Lee, N.3
Seah, S.4
Koh, C.5
Wang, J.6
-
4
-
-
10444246545
-
Impact reliability of solder joints
-
M. Date, T. Shoji, M. Fujiyoshi, K. Sato, K. N. Tu, "Impact reliability of solder joints", Proc. 54th ECTC, 2004, pp. 668-674.
-
(2004)
Proc. 54th ECTC
, pp. 668-674
-
-
Date, M.1
Shoji, T.2
Fujiyoshi, M.3
Sato, K.4
Tu, K.N.5
-
5
-
-
33845571954
-
Micro impact characterisation of solder joint for drop impact application
-
E.H. Wong, Y-W Mai, R. Rajoo, K.T. Tsai, F. Liu, S.K.W. Seah and C-L Yeh, "Micro impact characterisation of solder joint for drop impact application", Proc. 56th ECTC, 2006, pp. 64-71.
-
(2006)
Proc. 56th ECTC
, pp. 64-71
-
-
Wong, E.H.1
Mai, Y.-W.2
Rajoo, R.3
Tsai, K.T.4
Liu, F.5
Seah, S.K.W.6
Yeh, C.-L.7
-
6
-
-
36348989735
-
Analytical Solutions for Interconnect Stress in Board Level Drop Impact
-
E.H. Wong, Y-W Mai, S.K.W Seah, K.M. Lim, T.B. Lim, "Analytical Solutions for Interconnect Stress in Board Level Drop Impact", IEEE Advanced Packaging, 2007, Vol. 30, No. 4, pp 654-664.
-
(2007)
IEEE Advanced Packaging
, vol.30
, Issue.4
, pp. 654-664
-
-
Wong, E.H.1
Mai, Y.-W.2
Seah, S.K.W.3
Lim, K.M.4
Lim, T.B.5
-
7
-
-
34250717016
-
Submodeling technique for BGA reliability analysis of CSP packaging subjected to an impact loading
-
L. Zhu, "Submodeling technique for BGA reliability analysis of CSP packaging subjected to an impact loading", Proc. InterPACK, 2001, IPACK2001-15873.
-
Proc. InterPACK, 2001, IPACK2001-15873
-
-
Zhu, L.1
-
8
-
-
27644445720
-
Modeling solder joint reliability of BGA packages subject to drop impact loading using submodeling
-
J. Wang, C. Hoe, E.H. Wong, "Modeling solder joint reliability of BGA packages subject to drop impact loading using submodeling", Proc. Abaqus Users' Conference, 2002.
-
(2002)
Proc. Abaqus Users' Conference
-
-
Wang, J.1
Hoe, C.2
Wong, E.H.3
-
9
-
-
30844434820
-
Support excitation scheme for transient analysis of JEDEC board-level drop test
-
C.-L. Yeh, Y.-S. Lai, "Support excitation scheme for transient analysis of JEDEC board-level drop test", Microelectronics & Reliability, 2006, Vol. 46, pp. 626-636.
-
(2006)
Microelectronics & Reliability
, vol.46
, pp. 626-636
-
-
Yeh, C.-L.1
Lai, Y.-S.2
-
10
-
-
33645142768
-
Transient fracturing of solder joints subjected to displacement-controlled impact loads
-
C.-L. Yeh, Y.-S. Lai, "Transient fracturing of solder joints subjected to displacement-controlled impact loads", Microelectronics & Reliability, 2006, Vol. 46, pp. 885-895.
-
(2006)
Microelectronics & Reliability
, vol.46
, pp. 885-895
-
-
Yeh, C.-L.1
Lai, Y.-S.2
-
11
-
-
11244331550
-
Fatigue damage modeling in solder interconnects using a cohesive zone approach
-
A. Abdul-Baqi, P.J.G. Schreurs, M.G.D. Geers, "Fatigue damage modeling in solder interconnects using a cohesive zone approach", International Journal of Solids and Structures, 2005, pp. 927-942.
-
(2005)
International Journal of Solids and Structures
, pp. 927-942
-
-
Abdul-Baqi, A.1
Schreurs, P.J.G.2
Geers, M.G.D.3
-
12
-
-
33845588989
-
-
P. Towashiraporn, C. Xie, Cohesive modeling of solder interconnect failure in board level drop test, 2006 ITHERM, pp. 817-825.
-
P. Towashiraporn, C. Xie, "Cohesive modeling of solder interconnect failure in board level drop test", 2006 ITHERM, pp. 817-825.
-
-
-
-
13
-
-
51349144810
-
A Study of Crack Propagation in Pb-free Solder Joints under Drop Impact, to be presented at 58th
-
J.F.J.M.Caers, E.H.Wong, S.K.W Seah, C.S. Selvanayagam, X. J. Zhao, W.D. van Driel, N. Owen, M. Leoni, L.C. Tan, P.L. Eu, Yi-Shao Lai, Chang-Lin Yeh, "A Study of Crack Propagation in Pb-free Solder Joints under Drop Impact", to be presented at 58th ECTC.
-
ECTC
-
-
Caers, J.F.J.M.1
Wong, E.H.2
Seah, S.K.W.3
Selvanayagam, C.S.4
Zhao, X.J.5
van Driel, W.D.6
Owen, N.7
Leoni, M.8
Tan, L.C.9
Eu, P.L.10
Shao Lai, Y.11
Lin Yeh, C.12
|