|
Volumn 2006, Issue , 2006, Pages 817-825
|
Cohesive modeling of solder interconnect failure in board level drop test
|
Author keywords
Cohesive; Crack propagation; Drop; Failure; Finite element analysis; Impact; Solder
|
Indexed keywords
COHESIVE;
DROPS;
IMPACT;
SOLDER INTERCONNECTS;
COMPUTER SIMULATION;
CRACK PROPAGATION;
ELECTRONIC EQUIPMENT;
FINITE ELEMENT METHOD;
SOLDERING;
|
EID: 33845588989
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ITHERM.2006.1645431 Document Type: Conference Paper |
Times cited : (26)
|
References (10)
|