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Volumn , Issue , 2008, Pages 1544-1549

Design and development of a multi-die embedded micro wafer level package

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC COMPOUNDS; AUTOMOBILE ELECTRONIC EQUIPMENT; CHIP SCALE PACKAGES; COMPUTER NETWORKS; DIES; ELECTRIC CONNECTORS; ELECTRONICS INDUSTRY; FLIP CHIP DEVICES; INTEGRATION; LAPTOP COMPUTERS; MINIATURE INSTRUMENTS; PACKAGING; PACKAGING MATERIALS; PERSONAL COMPUTERS; PRINTED CIRCUIT BOARDS; PRINTED CIRCUIT MANUFACTURE; PRINTED CIRCUITS; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SILICON WAFERS; STRUCTURAL ANALYSIS; TELECOMMUNICATION EQUIPMENT; WAFER BONDING; WIRE;

EID: 51349144172     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2008.4550181     Document Type: Conference Paper
Times cited : (36)

References (19)
  • 1
    • 51349136286 scopus 로고    scopus 로고
    • see
    • see http://public.itrs.net
  • 2
    • 24644476611 scopus 로고    scopus 로고
    • Wafer Level Processing of 3D System in Package for RF and Data Applications
    • Lake Buena Vista, FL, June
    • J.-C. Souriau et al., "Wafer Level Processing of 3D System in Package for RF and Data Applications", 55th Electronic Components and Technology Conf, Lake Buena Vista, FL, June 2005, p. 356
    • (2005) 55th Electronic Components and Technology Conf , pp. 356
    • Souriau, J.-C.1
  • 5
    • 4544239391 scopus 로고    scopus 로고
    • A field mill based on the modular MEMS framework MATCH-X
    • Bremen, Germany, June 10-12
    • P. Maruscheck, J. Evers, W. Schaefer, M. Nienhaus, and S. Kleen, "A field mill based on the modular MEMS framework MATCH-X," in Proc. Actuator 2002, Bremen, Germany, June 10-12, 2002, pp. 316-320.
    • (2002) Proc. Actuator , pp. 316-320
    • Maruscheck, P.1    Evers, J.2    Schaefer, W.3    Nienhaus, M.4    Kleen, S.5
  • 7
    • 4544296903 scopus 로고    scopus 로고
    • Innovative 3D solutions for multiple die packaging
    • IL, pp
    • V. Solberg, "Innovative 3D solutions for multiple die packaging," in Proc. SMTA 2003, IL, pp. 626-630.
    • (2003) Proc. SMTA , pp. 626-630
    • Solberg, V.1
  • 10
    • 84964691120 scopus 로고    scopus 로고
    • Wafer Level Encapsulation - A transfer Molding Approach to System in Package Generation
    • Singapore
    • T. Braun et al., "Wafer Level Encapsulation - A transfer Molding Approach to System in Package Generation", in proceedings of EPTC 2002, Singapore.
    • (2002) proceedings of EPTC
    • Braun, T.1
  • 11
    • 28444498414 scopus 로고    scopus 로고
    • Process Flow and Manufacturing Concept for Embedded Active Devices
    • Singapore
    • R. Aschenbrenner et al., "Process Flow and Manufacturing Concept for Embedded Active Devices", in proceedings of EPTC 2004, Singapore.
    • (2004) proceedings of EPTC
    • Aschenbrenner, R.1
  • 12
    • 33845582061 scopus 로고    scopus 로고
    • Embedded Active Device Packaging Technoloogy for Next-Generation Chip-in-Substrate Packages, CiSP
    • US
    • C. T. Ko et al, "Embedded Active Device Packaging Technoloogy for Next-Generation Chip-in-Substrate Packages, CiSP", in proceedings of ECTC 2006, US.
    • (2006) proceedings of ECTC
    • Ko, C.T.1
  • 13
    • 33847335627 scopus 로고    scopus 로고
    • Wafer Level Processing on Re-built Wafer for Chip Staking
    • Singapore
    • J. C. Souriau et al, "Wafer Level Processing on Re-built Wafer for Chip Staking", in proceedings EPTC 2005, Singapore.
    • (2005) proceedings EPTC
    • Souriau, J.C.1
  • 14
    • 33845571094 scopus 로고    scopus 로고
    • An Embedded Device Technology Based on a Molded Reconfigured Wafer
    • US
    • M. Brunnbauer et al., "An Embedded Device Technology Based on a Molded Reconfigured Wafer", in proceedings of ECTC 2006, US.
    • (2006) proceedings of ECTC
    • Brunnbauer, M.1
  • 15
    • 35348921121 scopus 로고    scopus 로고
    • The Redistributed Chip Package: A Breakthrough for Advanced Packaging
    • B. Keser et al., "The Redistributed Chip Package: A Breakthrough for Advanced Packaging", in proceedings of ECTC 2007
    • (2007) proceedings of ECTC
    • Keser, B.1
  • 16
    • 10444236402 scopus 로고    scopus 로고
    • Accumulated Creep Strain and Energy Density Based Thermal Fatigue Life Prediction Models for SnAgCu Solder Joints
    • Ahmer Syed, "Accumulated Creep Strain and Energy Density Based Thermal Fatigue Life Prediction Models for SnAgCu Solder Joints", in proceedings of ECTC 2004.
    • (2004) proceedings of ECTC
    • Syed, A.1
  • 18
    • 51349152945 scopus 로고    scopus 로고
    • Lau, J. H., and W. Dauksher, Creep of Sn-(3.5-3.9)wt%Ag-(0.5-0.8) wt%Cu Lead-Free Solder, in Micromaterials and Nanomaterials, Edited by B. Michel, Fraunhofer Institute, IZM, Berlin, 2004, pp. 54-62.
    • Lau, J. H., and W. Dauksher, "Creep of Sn-(3.5-3.9)wt%Ag-(0.5-0.8) wt%Cu Lead-Free Solder", in Micromaterials and Nanomaterials, Edited by B. Michel, Fraunhofer Institute, IZM, Berlin, 2004, pp. 54-62.
  • 19
    • 0038350870 scopus 로고    scopus 로고
    • Accurate Predictions of Flip Chip BGA Warpage
    • Yuan Li, "Accurate Predictions of Flip Chip BGA Warpage", in proceedings of ECTC 2003.
    • (2003) proceedings of ECTC
    • Li, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.