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Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 5, Issue 5, 2008, Pages 1324-1327

Optical characterization of phase changing Ge2Sb 2Te5 chalcogenide films

(6) Franta, Daniel a Hrdlicka, Martin b Necas, David a Frumar, Miloslav b Ohlídal, Ivan a Pavlišta, Martin b

a MASARYK UNIVERSITY (Czech Republic)

b UNIVERSITY OF PARDUBICE (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

CHALCOGENIDE FILMS; DENSITY OF ELECTRONIC STATE; DISPERSION MODELS; FREE CARRIERS; LOWER ENERGIES; OPTICAL CHARACTERIZATION; PHASE CHANGE; POLYCRYSTALLINE STRUCTURE; SPECTROSCOPIC REFLECTOMETRY; UPPER BOUNDARY; VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY;

ANNEALING; DISPERSIONS; ELECTRONIC STATES; GERMANIUM; SPECTROSCOPIC ELLIPSOMETRY; SYSTEM THEORY; TELLURIUM COMPOUNDS;

AMORPHOUS FILMS;

EID: 51049106420 PISSN: 18626351 EISSN: 16101642 Source Type: Journal
DOI: 10.1002/pssc.200777768 Document Type: Conference Paper

Times cited : (8)

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