Properties of the electron beam in a room-temperature electron beam ion source investigated by position sensitive x-ray detection

Review of Scientific Instruments

Volumn 79, Issue 8, 2008, Pages

  Silze, A ^a   Zschornack, G ^a   Ovsyannikov, V P ^b   Ullmann, F ^b  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b DREEBIT GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; ELECTRON ENERGY LEVELS; ELECTRON GUNS; ELECTRON OPTICS; ELECTRON TRAPS; ELEMENTARY PARTICLE SOURCES; ION SOURCES; MAGNETIC DEVICES; MAGNETIC FLUX; MAGNETS; PARTICLE BEAMS;

ELECTRON-BEAM;

IONS;

EID: 50849115779     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2960568     Document Type: Article

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