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Volumn 65, Issue 10, 1996, Pages 3186-3192

A New Versatile Electron-Beam Ion Trap

Author keywords

EBIT; Electron beam; Highly charged ions; Ion trap; Trap; X ray source

Indexed keywords


EID: 0030364643     PISSN: 00319015     EISSN: None     Source Type: Journal    
DOI: 10.1143/JPSJ.65.3186     Document Type: Article
Times cited : (111)

References (32)
  • 6
    • 0342600058 scopus 로고
    • Physics with Multiply Charged Ions
    • ed. D. Liesen, ISBN 0-306-45114-X
    • D. Knapp: NATO ASI Series, Physics with Multiply Charged Ions ., ed. D. Liesen, ISBN 0-306-45114-X (1994) p. 143.
    • (1994) NATO ASI Series , pp. 143
    • Knapp, D.1
  • 30
    • 2742528200 scopus 로고
    • Los Alamos National Laboratory, LA-UR-87-126
    • POISSON Reference Manual (Los Alamos National Laboratory, 1987) LA-UR-87-126.
    • (1987) POISSON Reference Manual


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.