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Volumn 92, Issue , 2001, Pages 110-112
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First results from the Freiburg electron beam ion trap FreEBIT
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON BEAMS;
ELECTRON TRANSITIONS;
IMAGE ANALYSIS;
IONS;
OPTICAL RESOLVING POWER;
SPECTROGRAPHS;
X RAY SPECTROSCOPY;
ELECTRON BEAM ION TRAPS (EBIT);
HIGHLY CHARGED IONS (HCI);
ELECTRON TRAPS;
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EID: 0035716923
PISSN: 02811847
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (17)
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References (5)
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