Extraction of highly charged ions from the electron beam ion trap at LBNL for applications in surface analysis and materials science

Review of Scientific Instruments

Volumn 73, Issue 2 II, 2002, Pages 663-

  Schenkel, T ^a   Persaud, A ^a   Kraemer, A ^a   McDonald, J W ^b   Holder, J P ^b   Hamza, A V ^b   Schneider, D H ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

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Indexed keywords

EID: 0036473153     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1429775     Document Type: Conference Paper

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