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Volumn 235, Issue 1-4, 2005, Pages 514-518

Dresden EBIT: The next generation

Author keywords

EBIT; Ge 31+; Highly charged ions; Ion extraction; Kr34+; X ray spectroscopy; Xe44+

Indexed keywords

CYCLOTRON RESONANCE; GERMANIUM; ION EXCHANGE; IRON; KRYPTON; PARTICLE ACCELERATORS; X RAY SPECTROSCOPY; XENON;

EID: 20144383867     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.03.235     Document Type: Conference Paper
Times cited : (11)

References (9)
  • 2
    • 7744241423 scopus 로고    scopus 로고
    • Electron beam ion traps and their use in the study of highly charged ions
    • F.J. Currell Kluwer Academic Press Dordrecht
    • F.J. Currell Electron beam ion traps and their use in the study of highly charged ions F.J. Currell The physics of multiply and highly charged ions 2003 Kluwer Academic Press Dordrecht 39
    • (2003) The Physics of Multiply and Highly Charged Ions , pp. 39
    • Currell, F.J.1
  • 3
    • 20144385687 scopus 로고    scopus 로고
    • http://www.dresden-ebit.de and references therein
    • Available from: 〈http://www.physik.tu-dresden.de/apg〉 and 〈http://www.dresden-ebit.de〉 and references therein.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.