메뉴 건너뛰기




Volumn 29, Issue 9, 2008, Pages 974-976

V-Gate GaN HEMTs for X-Band power applications

Author keywords

GaN; High electron mobility transistors (HEMTs); Power amplifier; V gate; X band

Indexed keywords

ELECTRON MOBILITY; GALLIUM NITRIDE; SEMICONDUCTING GALLIUM;

EID: 50649125871     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2008.2001639     Document Type: Article
Times cited : (44)

References (11)
  • 5
    • 46049092224 scopus 로고    scopus 로고
    • M. Micovic, A. Kurdoghlian, P. Hashimoto, M. Hu, M. Antcliffe, P. J. Willadsen, W. S. Wong, R. Bowen, I. Milosavljevic, A. Schmitz, M. Wetzel, and D. H. Chow, GaN HFET for W-band power applications, in IEDM Tech. Dig., Dec. 2006, pp. 15.6.1-15.6.3.
    • M. Micovic, A. Kurdoghlian, P. Hashimoto, M. Hu, M. Antcliffe, P. J. Willadsen, W. S. Wong, R. Bowen, I. Milosavljevic, A. Schmitz, M. Wetzel, and D. H. Chow, "GaN HFET for W-band power applications," in IEDM Tech. Dig., Dec. 2006, pp. 15.6.1-15.6.3.
  • 8
    • 41749090482 scopus 로고    scopus 로고
    • Correlation between DC-RF dispersion and gate leakage in deeply-recessed GaN/AlGaN/GaN HEMTs
    • Apr
    • R. M. Chu, L. K. Shen, N. Fichtenbaum, Z. Chen, S. Keller, S. P. DenBaars, and U. K. Mishra, "Correlation between DC-RF dispersion and gate leakage in deeply-recessed GaN/AlGaN/GaN HEMTs," IEEE Electron Device Lett., vol. 29, no. 4, pp. 303-305, Apr. 2008.
    • (2008) IEEE Electron Device Lett , vol.29 , Issue.4 , pp. 303-305
    • Chu, R.M.1    Shen, L.K.2    Fichtenbaum, N.3    Chen, Z.4    Keller, S.5    DenBaars, S.P.6    Mishra, U.K.7
  • 11
    • 41749103778 scopus 로고    scopus 로고
    • Plasma treatment for leakage reduction in AlGaN/GaN and GaN Schottky diodes
    • Apr
    • R. M. Chu, L. K. Shen, N. Fichtenbaum, D. Brown, S. Keller, and U. K. Mishra, "Plasma treatment for leakage reduction in AlGaN/GaN and GaN Schottky diodes," IEEE Electron Device Lett., vol. 29, no. 4, pp. 297-299, Apr. 2008.
    • (2008) IEEE Electron Device Lett , vol.29 , Issue.4 , pp. 297-299
    • Chu, R.M.1    Shen, L.K.2    Fichtenbaum, N.3    Brown, D.4    Keller, S.5    Mishra, U.K.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.