Si-capping of Ge nanohuts on Si(001) analyzed by scanning tunneling microscopy and the finite element method

Applied Physics Letters

Volumn 85, Issue 10, 2004, Pages 1781-1783

  Goldfarb, I ^a   Banks Sills, L ^a   Eliasi, R ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

INTERATOMIC SPACINGS; NANOCRYSTALS; STRAIN ENERGY; THERMAL STRAIN;

ANNEALING; COMPUTER SIMULATION; CRYSTAL LATTICES; DEPOSITION; FINITE ELEMENT METHOD; GERMANIUM; INTERFACIAL ENERGY; MOLECULAR BEAM EPITAXY; SCANNING TUNNELING MICROSCOPY; SEGREGATION (METALLOGRAPHY); SELF ASSEMBLY; SILICON WAFERS; THERMAL EXPANSION; ULTRAHIGH VACUUM;

NANOSTRUCTURED MATERIALS;

EID: 5044238722     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1787958     Document Type: Article

References (20)

1. Y.-W. Mo, D. E. Savage, B. S. Swartzentruber, and M. G. Lagally, Phys. Rev. Lett. 64, 1943 (1990).
2. I. Goldfarb, P. T. Hayden, J. H. G. Owen, and G. A. D. Briggs, Phys. Rev. Lett. 78, 3959 (1997).
3. G. Medeiros-Ribeiro, A. M. Bratkovski, T. I. Kamins, D. A. A. Ohlberg, and R. S. Williams, Science 279, 353 (1998).
4. T. I. Kamins, G. Medeiros-Ribeiro, D. A. A. Ohlberg, and R. S. Williams, J. Appl. Phys. 85, 1159 (1999).
5. S. A. Chaparro, J. Drucker, Y. Zhang, D. Chandrasekhar, M. R. McCartney, and D. J. Smith, Phys. Rev. Lett. 83, 1199 (1999).
6. X. Z. Liao, J. Zou, D. J. H. Cockayne, Z. M. Jiang, X. Wang, and R. Leon, Appl. Phys. Lett. 77, 1304 (2000).
7. I. Goldfarb, P. T. Hayden, J. H. G. Owen, and G. A. D. Briggs, Phys. Rev. B 56, 10459 (1997).
8. Y. H. Xie, G. H. Gilmer, C. Roland, P. J. Silverman, S. K. Buratto, Y. J. Cheng, E. A. Fitzgerald, A. R. Kortan, S. Schupler, M. A. Marcus, and P. H. Citrin, Phys. Rev. Lett. 73, 3006 (1994).
9. P. Sutter and M. G. Lagally, Phys. Rev. Lett. 81, 3471 (1998).
10. P. Sutter, E. Matveeva, and M. G. Lagally, J. Vac. Sci. Technol. B 16, 1560 (1998).
11. M. Kummer, B. Vögeli, and H. von Känel, Mater. Sci. Eng., B 69-70, 247 (2000).
12. N. Usami, M. Miura, Y. Ito, Y. Araki, and Y. Shiraki, Appl. Phys. Lett. 77, 217 (2000).
13. A. Rastelli, M. Kummer, and H. von Känel, Phys. Rev. Lett. 87, 256101-1 (2001).
14. E. Müller, O. Kirfel, A. Rastelli, H. von Känel, and D. Grützmacher, Mater. Sci. Eng., B 101, 142 (2003).
15. A. Rastelli, H. von Känel, G. Albini, P. Raiteri, D. B. Migas, and L. Miglio, Phys. Rev. Lett. 90, 216104 (2003).
16. I. Goldfarb and G. A. D. Briggs, Surf. Sci. 433-435, 449 (1999).
17. I. Goldfarb, L. Banks-Sills, R. Eliasi, and G. A. D. Briggs, Interface Sci. 10, 75 (2002).
18. D. J. Bottomly and P. Fonce, J. Cryst. Growth 160, 407 (1996).
19. S. H. Christiansen, Ph.D. Dissertation, Lehrstuhl für Mikrocharakterisierung, Friedrich-Alexander-Universität, Erlangen-Nürnberg (1997).
20. M. Stoffel, U. Denker, G. S. Kar, H. Sigg, and O. G. Schmidt, Appl. Phys. Lett. 83, 2910 (2003).