Comparative STM and RHEED studies of Ge/Si(001) and Si/Ge/Si(001) surfaces

Surface Science

Volumn 433, Issue , 1999, Pages 449-454

  Goldfarb, I ^a   Briggs, G A D ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; LATTICE CONSTANTS; MORPHOLOGY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; SURFACE ROUGHNESS; SURFACE TOPOGRAPHY; SURFACE TREATMENT; THREE DIMENSIONAL; TWO DIMENSIONAL;

LATTICE MISMATCH; STRAINED SURFACE;

SURFACE STRUCTURE;

EID: 0033330401     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00113-2     Document Type: Article

References (19)

1. J.H. Van der Merwe, C.A.B. Ball, in: J.W. Matthews (Ed.), Epitaxial Growth - Part B, Academic Press, New York, 1975, p. 493.
2. Y.-W. Mo, D.E. Savage, B.S. Swartzentruber, M.G. Lagally, Phys. Rev. Lett. 64 (1990) 1943.
3. G. Medeiros-Ribeiro, A.M. Bratkowsky, T.I. Kamins, D.A.A. Ohlberg, R.S. Williams, Science 279 (1998) 353.
4. I. Goldfarb, P.T. Hayden, J.H.G. Owen, G.A.D. Briggs, Phys. Rev. Lett. 78 (1997) 3959.
5. A.J. Cullis, D.J. Robbins, A.J. Pidduck, P.W. Smith, J. Cryst. Growth 123 (1992) 333.
6. S.K. Zhang, H.J. Zhu, F. Lu, Z.M. Jiang, X. Wang, Phys. Rev. Lett. 80 (1998) 3340.
7. X. Wang, Z.M. Jiang, H.J. Zhu, F. Lu, X. Liu, C.W. Hu, Y. Chen, Z. Zhu, Appl. Phys. Lett. 71 (1997) 3543.
8. M.G. Lagally, D.E. Savage, M.C. Tringides, in: P.K. Larsen, P.J. Dobson (Eds.), Reflection High Energy Electron Diffraction and Reflection Imaging of Surfaces, Plenum, New York, 1988, p. 139.
9. J.E. Mahan, K.M. Geib, G.Y. Robinson, R.G. Long, J. Vac. Sci. Technol. A 8 (1990) 3692.
10. K. Miki, K. Sakamoto, T. Sakamoto, Appl. Phys. Lett. 71 (1997) 2434.
11. Y. Koide, S. Zaima, N. Ohshima, Y. Yasuda, J. Cryst. Growth 99 (1990) 254.
12. C.E. Aumann, Y.-W. Mo, M.G. Lagally, Appl. Phys. Lett. 59 (1991) 1061.
13. K.M. Chen, D.E. Jesson, S.J. Pennycook, T. Thundat, R.J. Warmack, J. Vac. Sci. Technol. B 14 (1996) 2199.
14. P.W. Deelman, T. Thundat, L.J. Schowalter, Appl. Surf. Sci. 104 (105) (1996) 510.
15. R. Butz, S. Kampers, Appl. Phys. Lett. 61 (1992) 1307.
16. I. Goldfarb, J.H.G. Owen, P.T. Hayden, D.R. Bowler, K. Miki, G.A.D. Briggs, Surf. Sci. 394 (1997) 105.
17. M.-H. Tsai, Y.-S. Tsai, C.S. Chang, Y. Wei, I.S.T. Tsong, Phys. Rev. B 56 (1997) 7435, and references therein.
18. I. Goldfarb, J.H.G. Owen, D.R. Bowler, C.M. Goringe, P.T. Hayden, K. Miki, D.G. Pettifor, G.A.D. Briggs, J. Vac. Sci. Technol. A 16 (1998) 1938.
19. D.E. Jesson, S.J. Pennycook, J.-M. Baribeau, Phys. Rev. Lett. 66 (1991) 750.