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Volumn , Issue , 2006, Pages 4993-4998

Using co-design techniques to increase the reliability of the electronic control system for a multilevel power converter

Author keywords

[No Author keywords available]

Indexed keywords

CONCURRENCY CONTROL; ELECTRONICS INDUSTRY; INDUSTRIAL ELECTRONICS; POWER CONVERTERS; POWER ELECTRONICS; RELIABILITY; REMOTE CONTROL; SERVOMECHANISMS; SOFTWARE DESIGN; SOFTWARE RELIABILITY;

EID: 50249115216     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IECON.2006.347760     Document Type: Conference Paper
Times cited : (1)

References (12)
  • 3
    • 0032304921 scopus 로고    scopus 로고
    • Optimizing HW/SW Co-design towards Reliability for Critical-Application Systems
    • F. Vargas, E. Bezerra, L. Wulff, and D. Barros Jr., "Optimizing HW/SW Co-design towards Reliability for Critical-Application Systems", Asian Test Symposium, 1998.
    • (1998) Asian Test Symposium
    • Vargas, F.1    Bezerra, E.2    Wulff, L.3    Barros Jr., D.4
  • 4
    • 50249156127 scopus 로고    scopus 로고
    • http://www.spectrumdigital.com
  • 5
    • 50249085262 scopus 로고    scopus 로고
    • http://www.digilentinc.com
  • 6
    • 30844443384 scopus 로고    scopus 로고
    • Reliability-Centric High-Level Synthesis
    • S. Tosun†, N. Mansouri†, E. Arvas†, Reliability-Centric High-Level Synthesis, DATE 2005: 1258-1263
    • (2005) DATE , pp. 1258-1263
    • Tosun†, S.1    Mansouri†, N.2    Arvas†, E.3
  • 8
    • 0033900509 scopus 로고    scopus 로고
    • P. Hazucha and C. Svensson, Optimized test circuits for SER characterization of a manufacturing process , Solid-State Circuits, 2000.
    • P. Hazucha and C. Svensson, "Optimized test circuits for SER characterization of a manufacturing process ", Solid-State Circuits, 2000.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.