Optimizing HW/SW codesign towards reliability for critical-application systems

Proceedings of the Asian Test Symposium

Volumn , Issue , 1998, Pages 52-57

  Vargas, F ^a   Bezerra, E ^a   Wulff, L ^a   Barros Jr , D ^a  

^a PONTIFICAL CATHOLIC UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

SAFETY-CRITICAL COMPUTING SYSTEMS;

C (PROGRAMMING LANGUAGE); COMPUTER SYSTEMS PROGRAMMING; PROGRAM COMPILERS; RELIABILITY; RESPONSE TIME (COMPUTER SYSTEMS); SOFTWARE ENGINEERING;

COMPUTER ARCHITECTURE;

EID: 0032304921     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)

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